Description
The GR716A features a fault-tolerant LEON3 SPARC V8 processor, communication interfaces and on-chip ADC, DAC, Power-on-Reset, Oscillator, Brown-out detection, LVDS transceivers, regulators to support for single 3.3V supply, ideally suited for space and other high-rel applications. The GR716A is supported by a software development environment described below.
Specifications
- System frequency up-to 50 MHz
- SpaceWire links up-to 100 Mbps
- CQFP132 hermetically sealed ceramic package
- Total Ionizing Dose (TID) up to 100 krad (Si, functional)
- Single-Event Latch-Up (SEL) to LETTH > 118 MeV-cm2mg
- Single-Event Upset (SEU) below 7E-6 event/device/day in typical space orbits
- Support for single 3.3V supply
Features
- Fault-tolerant SPARC V8 processor with 31 register windows
- 16-bit instruction set: LEON-REX for improved code density
- Double precision IEEE-754 floating point unit
- Memory protection units with 8 zones and individual access control of peripherals
- Deterministic software execution and non-intrusive debugging
- Fast context switching (PWRPSR, AWP, register partitioning, interrupt mapping, SVT, MVT)
- Interrupt zero jitter delay
- Non-intrusive advanced on-chip debug support unit with trace buffers and statistics
- External EDAC memory: 8-bit PROM/SRAM, SPI, I2C
- SpaceWire interface with time distribution support, 100 Mbps
- MIL-STD-1553B interface
- 2x CAN 2.0B controller interface
- PacketWire with CRC acceleration support
- Programmable PWM interface
- SPI with SPI-for-Space protocols
- UARTs, I2C, GPIO, Timers with Watchdog
- Interrupt controller, Status registers, etc.
- Dual ADC 11bits @ 200Ksps, 4 differential or 8 single ended
- DAC 12bits @ 3Msps, 4 channels
- Mixed General purpose inputs and outputs
- Power-on-Reset and Brown-out-detection
- Temperature sensor, Integrated PLL
- On-chip regulator for 3.3V single supply
Integrated Analog functions
- Dual 11 bits 200KS/s SAR ADC with Pre-amplifier
- 12 bit 3.75MS/s Rad Hardened DAC
- Rad Hardened PLL
- Crystal Oscillator
- Power On System Reset
- 1.8V and 3.3V voltage monitors
- GPIO with local Power on Control
- LVDS transceivers with build-in reference
- Rad Hardened voltage and current reference
- Rad Hardened Low-drop regulators for single supply support
- Rad Hardened external voltage references
- Rad Hardened high density RAM with EDAC protection
Memory support
- 192KiB EDAC protected tightly coupled memory with single cycle access from processor and ATOMIC bit operations
- Embedded ROM with bootloader for initializing and remote access
- Dedicated SPI Memory interface with boot ROM capability
- I2C memory interface with boot ROM capability
- 8-bit SRAM/ROM I/F with support up to 16MiB ROM and 256MiB SRAM
- Scrubber with programmable scrub rate for all embedded memories and external PROM/SRAM and SPI memories
- Redundant boot memory (PROM/SRAM/SPI/I2C/NVRAM)
- Application software container for checking software integrity using CRC
- Boot from internal SRAM, external PROM/FLASH/SRAM/SPI/I2C memory
Applications
Support for many different standard interfaces makes the GR716A microcontroller ideally fit for handling supervision and control tasks in a satellite, such as
- propulsion system control
- sensor bus control
- robotics applications control
- simple motor control
- mechanism control
- power control
- particle detector instrumentation
- radiation environment monitoring
- thermal control
- antenna pointing control
- remote terminal unit control
- simple instrument control
Software Development Environment (SDE)
We provide compiler toolchains and development tools with GR716A specific support such as the GR716A BSPs, GRMON support and simulator CPU/IO models. The Bare-metal environment is free and open-source. The GR716-MINI board can be evaluated using the free GRMON3 evaluation version.
Our SDE for the GR716 consists of the following software components from:
Availability
Flight parts of the GR716A are available. The qualifications status for such parts is:
- Qualification tests as per PCA defined by ESCC Basic Specification No. 2567000
- Screening tests as per ESCC 9000
Detailed ordering information is described in the GR716-DS-UM.
Resources